Development and validation of the numerical model of Electron Cyclotron Resonance Ion Sources

TL;DR

This paper presents a numerical model of Electron Cyclotron Resonance Ion Sources that incorporates secondary electron emission, revealing its significant impact on electron confinement and ion production, and validates the model against experimental data.

Contribution

The paper introduces an enhanced numerical model of ECR ion sources including SEE effects, improving understanding of source behavior under various operational conditions.

Findings

SEE significantly affects electron confinement and ion yield

Model predictions align with experimental trends

Source response to gas flow and microwave power changes is characterized

Abstract

Processes of the secondary electron emission (SEE) from the walls are included into the Numerical Advanced Model of Electron Cyclotron Resonance Ion Sources (NAM-ECRIS). It is found that SEE strongly influences electron confinement time and ion production. With the modified model, we observe reactions of the source to changes in a gas flow into the source and in an injected microwave power. The source performance with scaling the hexapole magnetic field is investigated. The calculated tendencies are close to the experimental observations.