Accurately measuring phase profiles of structured light in optical manipulation

TL;DR

This paper introduces a novel interferometric method for precise phase measurement of structured light in optical trapping, enabling accurate phase profiling and rapid switching between measurement and manipulation, thus enhancing optical trapping performance.

Contribution

A new interferometric technique for accurate phase profiling of structured light in holographic optical trapping systems is proposed and validated.

Findings

Phase profiles match designed profiles accurately.

Fast switching between measurement and trapping is achieved.

Method improves optical trapping precision.

Abstract

Accurate phase measurement is highly desirable in optical manipulation driven by structured light, since the phase profiles have a close connection with optical force distribution, strongly affecting the capability of optical traps. Here, we report a novel interferometric phase measurement technique for accurately measuring the phase profiles of structured light in holographic optical trapping system. The related experiments are performed, in which the obtained phase profiles agree well with the designed phase profiles. It reveals that the phase profiles of structured light can be accurately obtained. Importantly, the fast switch between phase measurement and optical manipulation experiment can be easily realized, which are strongly preferable in optical trapping system. This study offers a promising way for accurately obtaining phase profiles of structure light, which is very helpful for realizing optical trapping with high performance.