The diffraction volume for square-shaped samples in X-ray diffraction with high spatial resolution

TL;DR

This paper uses numerical simulations to analyze the diffraction volume in high-resolution X-ray diffraction of square samples, revealing how sample rotation can improve depth sensitivity for micro- and nanoscopic material characterization.

Contribution

It introduces a numerical approach to compute the diffraction volume and demonstrates how sample rotation enhances depth sensitivity in high-resolution X-ray diffraction.

Findings

Numerical simulations effectively model diffraction volume in square samples.

Sample rotation improves partial depth sensitivity in diffraction measurements.

The method aids micro- and nanoscopic characterization of crystalline materials.

Abstract

X-ray diffraction with high spatial resolution is a prerequisite for the characterization of (poly)-crystalline materials on micro- or nanoscopic scales. This can be achieved by utilizing a focused X-ray beam and scanning of the sample. However, due to the penetration of the X-rays into the material, the exact location of diffraction within the sample is ambiguous. Here, we utilize numerical simulations to compute the spatially resolved diffraction volume in order to investigate these ambiguities. We demonstrate that partial depth sensitivity can be achieved by rotating the sample.