Off-axis electron holography for the direct visualization of perpendicular shape anisotropy in nano-scale 3D magnetic random-access-memory devices

TL;DR

This paper demonstrates the use of off-axis electron holography to directly visualize and analyze the magnetic configurations and thermal stability of nanoscale 3D MRAM devices, providing insights beyond traditional indirect measurement methods.

Contribution

It introduces a methodology for transferring and imaging individual nano-pillars of MRAM devices using electron holography, enabling direct observation of their magnetic behavior at the nanoscale.

Findings

Successful imaging of magnetic configurations in <20 nm MRAM nano-pillars

Detection of subtle variations in double magnetic tunnel junctions

Assessment of thermal stability during in-situ heating

Abstract

Perpendicular shape anisotropy (PSA) and double magnetic tunnel junctions (DMTJ) offer practical solutions to downscale spin-transfer-torque Magnetic Random-Access Memory (STT-MRAM) beyond 20 nm technology nodes, whilst retaining their thermal stability and reducing critical currents applied. However, as these modern devices become smaller and three-dimensionally (3D) complex, our understanding of their functional magnetic behavior is often indirect, relying on magnetoresistance measurements and micromagnetic modelling. In this paper, we review recent work that was performed on these structures using a range of advanced electron microscopy techniques, focusing on aspects specific to the 3D and nanoscale nature of such elements. We present the methodology for the systematic transfer of individual SST-MRAM nano-pillars from large-scale arrays to image their magnetic configurations directly using off-axis electron holography. We show that improved phase sensitivity through stacking of electron holograms can be used to image subtle variations in DMTJs and the thermal stability of < 20 nm PSA-STT-MRAM nano-pillars during in-situ heating. The experimental practicalities, benefits and limits of using electron holography for analysis of MRAM devices are discussed, unlocking practical pathways for direct imaging of the functional magnetic performance of these systems with high spatial resolution and sensitivity.