In-Circuit Impedance Measurement Setups of Inductive Coupling Approach: A Review
Zhenyu Zhao, Fei Fan, Huamin Jie, Zhenning Yang, Minghai Dong, Eng Kee, Chua, Kye Yak See

TL;DR
This paper reviews various in-circuit impedance measurement setups using inductive coupling, comparing their features, limitations, and applications to guide future research in non-contact EMC testing methods.
Contribution
It provides a comprehensive survey and comparison of existing inductive coupling impedance measurement setups, highlighting their characteristics and limitations.
Findings
Many setups exist with diverse characteristics
Identified limitations in current measurement approaches
Recommendations for future research directions
Abstract
In-circuit impedance measurement provides useful information for many EMC applications. The inductive coupling approach is a promising in-circuit impedance measurement method due to its non-contact characteristics and simple on-site implementation. Many measurement setups of this approach were reported. However, a comprehensive survey and comparison of these setups have not been found in the literature. This paper reviews these setups in terms of their characteristics, limitations, and applications. In addition, recommendations for future research are also presented.
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Taxonomy
TopicsElectromagnetic Compatibility and Noise Suppression · Electromagnetic Compatibility and Measurements · Microwave and Dielectric Measurement Techniques
