Quantum circuit debugging and sensitivity analysis via local inversions

TL;DR

This paper introduces a scalable method for debugging large quantum circuits by identifying the most influential sections affecting the output, without requiring classical verification, demonstrated on IBM quantum hardware.

Contribution

The authors develop a novel local inversion-based technique for pinpointing error sources in large quantum circuits, enabling scalable debugging without classical simulation.

Findings

Effective identification of critical circuit sections affecting output

Scalable debugging method demonstrated on IBM quantum devices

No classical output verification needed

Abstract

As the width and depth of quantum circuits implemented by state-of-the-art quantum processors rapidly increase, circuit analysis and assessment via classical simulation are becoming unfeasible. It is crucial, therefore, to develop new methods to identify significant error sources in large and complex quantum circuits. In this work, we present a technique that pinpoints the sections of a quantum circuit that affect the circuit output the most and thus helps to identify the most significant sources of error. The technique requires no classical verification of the circuit output and is thus a scalable tool for debugging large quantum programs in the form of circuits. We demonstrate the practicality and efficacy of the proposed technique by applying it to example algorithmic circuits implemented on IBM quantum machines.