A New Correction to the Rytov Approximation for Strongly Scattering Lossy Media
Amartansh Dubey, Xudong Chen, Ross Murch

TL;DR
This paper introduces an extended Rytov approximation (xRA-LM) that significantly enhances wave scattering predictions in strongly scattering, lossy media, enabling accurate modeling of high permittivity objects up to 50 times beyond traditional methods.
Contribution
The paper develops a novel correction to the Rytov approximation incorporating high frequency inhomogeneous wave theory for lossy media, extending its validity range for strong scattering conditions.
Findings
xRA-LM accurately predicts scattering from high permittivity objects.
It outperforms RA and BA in validity range for lossy media.
First non-iterative model with large validity in permittivity and size.
Abstract
We propose a correction to the conventional Rytov approximation (RA) and investigate its performance for predicting wave scattering under strong scattering conditions. An important motivation for the correction and investigation is to help in the development of better models for inverse scattering. The correction is based upon incorporating the high frequency theory of inhomogeneous wave propagation for lossy media into the RA formulation. We denote the technique as the extended Rytov approximation for lossy media (xRA-LM). xRA-LM significantly improves upon existing non-iterative linear scattering approximations such as RA and the Born approximation (BA) by providing a validity range for the permittivity of the objects of up to 50 times greater than RA. We demonstrate the technique by providing results for predicting wave scattering from piece-wise homogeneous scatterers in a…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsElectromagnetic Scattering and Analysis · Microwave Imaging and Scattering Analysis · Microwave and Dielectric Measurement Techniques
