Mode-walk-off interferometry for position-resolved optical fiber sensing
Luis Costa, Zhongwen Zhan, Alireza Marandi

TL;DR
This paper introduces a novel unidirectional, mode-walk-off interferometry technique for position-resolved optical fiber sensing, enabling local measurements without round-trip time-of-flight, suitable for complex fiber networks.
Contribution
It presents a new sensing method based on mode interference that works unidirectionally, overcoming limitations of existing bidirectional techniques in fiber sensing.
Findings
Successfully measured and localized axial strain and temperature changes.
Demonstrated compatibility with fiber links containing non-reciprocal elements.
Potential for ultra-long range distributed sensing in telecommunication systems.
Abstract
Simultaneously sensing and resolving the position of measurands along an optical fiber enables numerous opportunities, especially for application in environments where massive sensor deployment is not feasible. Despite significant progress in techniques based on round-trip time-of-flight measurements, the need for bidirectional propagation imposes fundamental barriers to their deployment in fiber communication links containing non-reciprocal elements. In this work, we break this barrier by introducing a position-resolved sensing technique based on the interference of two weakly-coupled non-degenerate modes of an optical fiber, as they walk-off through each other. We use this mode-walk-off interferometry to experimentally measure and localize physical changes to the fiber under test (axial strain and temperature) without the typical requirement of round-trip time-of-flight measurements.…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAdvanced Fiber Optic Sensors · Advanced Fiber Laser Technologies · Advanced Measurement and Metrology Techniques
