Temperature-dependent structure of an intermetallic ErPd$_2$Si$_2$ single crystal: A combined synchrotron and in-house X-ray diffraction study

TL;DR

This study investigates the temperature-dependent crystal structure of ErPd$_2$Si$_2$ single crystals using synchrotron and in-house X-ray diffraction, revealing no phase transitions and noting lattice parameter changes from 20 to 500 K.

Contribution

The paper provides detailed crystallographic data of ErPd$_2$Si$_2$ across a wide temperature range using combined diffraction techniques, highlighting structural stability and lattice variations.

Findings

No structural phase transition observed from 20 to 500 K.

Lattice constants vary with temperature, with a decreasing a and increasing c.

Unit cell volume increases slightly at higher temperature.

Abstract

We have grown intermetallic ErPd$_2$Si$_2$ single crystals employing laser-diodes with the floating-zone method. The temperature-dependent crystallography was determined using synchrotron and in-house X-ray powder diffraction measurements from 20 to 500 K. The diffraction patterns fit well with the tetragonal $I$4/$mmm$ space group (No. 139) with two chemical formulas within one unit cell. Our synchrotron X-ray powder diffraction study shows that the refined lattice constants are $a$ = 4.10320(2) {\AA}, $c$ = 9.88393(5) {\AA} at 298 K and $a$ = 4.11737(2) {\AA}, $c$ = 9.88143(5) {\AA} at 500 K, resulting in the unit-cell volume $V$ = 166.408(1) {\AA}$^3$ (298 K) and 167.517(2) {\AA}$^3$ (500 K). In the whole studied temperature range, we did not find any structural phase transition. Upon cooling, the lattice constants a and c are shortened and elongated, respectively.