Optical constants of several multilayer transition metal dichalcogenides measured by spectroscopic ellipsometry in the 300-1700 nm range: high-index, anisotropy, and hyperbolicity
Battulga Munkhbat, Piotr Wr\'obel, Tomasz J. Antosiewicz, Timur Shegai

TL;DR
This study provides comprehensive optical constants of various multilayer transition metal dichalcogenides over 300-1700 nm, revealing high refractive indices, anisotropy, and hyperbolic behavior, crucial for advancing nanophotonic applications.
Contribution
The paper presents the first broad spectral range measurements of dielectric constants for multiple TMD multilayers, including anisotropic and metallic types, using spectroscopic ellipsometry.
Findings
High refractive indices up to 4.84 observed
Significant optical anisotropy detected in several TMDs
Metallic TMDs exhibit hyperbolic and plasmonic properties
Abstract
Transition metal dichalcogenides (TMDs) attract significant attention due to their exceptional optical and excitonic properties. It was understood already in the 1960s, and recently rediscovered, that many TMDs possess high refractive index and optical anisotropy, which make them attractive for nanophotonic applications. However, accurate analysis and predictions of nanooptical phenomena require knowledge of dielectric constants along both in- and out-of-plane directions and over a broad spectral range -- information, which is often inaccessible or incomplete. Here, we present an experimental study of optical constants from several exfoliated TMD multilayers obtained using spectroscopic ellipsometry in the broad range of 300--1700 nm. The specific materials studied include semiconducting WS, WSe, MoS, MoSe, MoTe, as well as, in-plane anisotropic ReS, WTe, and…
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Taxonomy
Topics2D Materials and Applications · Chalcogenide Semiconductor Thin Films · Nanocluster Synthesis and Applications
