Correlating atom probe tomography with X-Ray and electron spectroscopies to understand microstructure-activity relationships in electrocatalysts
Baptiste Gault, Kevin Schweinar, Siyuan Zhang, Leopold Lahn, Christina, Scheu, Se-Ho Kim, Olga Kasian

TL;DR
This paper discusses integrating atom probe tomography with X-ray and electron spectroscopies to better understand the microstructure-activity relationships in electrocatalysts, aiming to guide the design of advanced energy materials.
Contribution
It introduces a methodology combining multiple microscopy and spectroscopy techniques to analyze electrocatalyst surfaces and sub-surfaces for improved material design.
Findings
Complementary techniques reveal detailed microstructure-activity links.
Bridging microscopy and spectroscopy enhances understanding of electrocatalyst surfaces.
Methodology supports rational design of energy materials.
Abstract
The search for a new energy paradigm with net-zero carbon emissions requires new technologies for energy generation and storage that are at the crossroad between engineering, chemistry, physics, surface and materials sciences. To keep pushing the inherent boundaries of device performance and lifetime, we need to step away from a cook-and-look approach and aim to establish the scientific ground to guide the design of new materials. This requires strong efforts in establishing bridges between microscopy and spectroscopy techniques, across multiple scales. Here, we discuss how the complementarities of X-ray- and electron-based spectroscopies and atom probe tomography can be exploited in the study of surfaces and sub-surfaces to understand structure-property relationships in electrocatalysts.
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Taxonomy
TopicsAdvanced Materials Characterization Techniques · Ion-surface interactions and analysis · Force Microscopy Techniques and Applications
