Optical Wavelength Meter with Machine Learning Enhanced Precision
Gazi Mahamud Hasan (1), Mehedi Hasan (1), Peng Liu (1), Mohammad Rad, (2), Eric Bernier (2), Trevor James Hall (1) ((1) Photonic Technology, Laboratory, Centre for Research in Photonics, University of Ottawa, Canada,, (2) Huawei Technologies Canada)

TL;DR
This paper presents a machine learning-enhanced optical wavelength measurement method that compensates for interferometer impairments, significantly improving precision over traditional techniques through simulation and experimental validation.
Contribution
It introduces a novel inverse mapping approach using machine learning to correct impairments in photonic interferometers for more accurate wavelength measurements.
Findings
Over an order of magnitude improvement in measurement precision
Robustness to noise and impairments demonstrated in simulations
Experimental validation on a Si3N4 platform confirms effectiveness
Abstract
Diverse applications in photonics and microwave engineering require a means of measurement of the instantaneous frequency of a signal. A photonic implementation typically applies an interferometer equipped with three or more output ports to measure the frequency dependent phase shift provided by an optical delay line. The components constituting the interferometer are prone to impairments which results in erroneous measurements. It is shown that the information to be retrieved is encoded by a three-component vector that lies on a circular cone within a three-dimensional Cartesian object space. The measured data belongs to the image of the object space under a linear map that describes the action of the interferometer. Assisted by a learning algorithm, an inverse map from the image space into the object space is constructed. The inverse map compensates for a variety of impairments while…
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Taxonomy
TopicsPhotonic and Optical Devices · Advanced Fiber Optic Sensors · Advanced Fiber Laser Technologies
