Complex structure and characterization of multi-photon split states in integrated circuits

TL;DR

This paper develops a theoretical framework for characterizing multi-photon split states in integrated circuits, enabling efficient measurement of their quantum properties with optimized, robust circuit designs.

Contribution

It formulates the structure of their reduced density matrices and proposes a scalable, robust measurement scheme using integrated optical circuits.

Findings

Density matrix fully characterized by sub-quadratic measurements

Optimized circuit designs minimize reconstruction error

Robustness to fabrication deviations demonstrated

Abstract

Multi-photon split states, where each photon is in a different spatial mode, represent an essential resource for various quantum applications, yet their efficient characterization remains an open problem. Here, we formulate the general structure of their reduced spatial density matrices and identify the number of real and complex-valued independent coefficients, which in particular completely determine the distinguishability of all photons. Then, we show that this density matrix can be fully characterized by measuring correlations after photon interference in a static integrated circuit, where the required outputs scale sub-quadratically versus the number of photons. We present optimized circuit designs composed of segmented coupled waveguides, representing a linear optical neural network, which minimize the reconstruction error and facilitate robustness to fabrication deviations.