A single-atom level mechano-optical transducer for ultrasensitive force sensing
Yang Liu, Pengfei Lu, Xinxin Rao, Hao Wu, Kunxu Wang, Qifeng Lao, Ji, Bian, Feng Zhu, Le Luo

TL;DR
This paper introduces a single-atom level mechano-optical transducer using a trapped ion that achieves ultrasensitive force detection with high spatial resolution, enabling advanced applications in surface science, biomolecular imaging, and fundamental physics.
Contribution
The study presents a novel single-ion based transduction scheme that converts micromotion into optical signals, achieving unprecedented force sensitivity and 3D force vector measurement.
Findings
Achieved force sensitivity of about 600 zN/√Hz.
Demonstrated 3D vector force measurement capability.
Enabled single-atom level spatial resolution.
Abstract
Using light as a probe to detect a mechanical motion is one of the most successful experimental approaches in physics. The history of mechanical sensing based on the reflection, refraction and scattering of light dates back to the 16th century, where in the Cavendish experiment, the angle of rotation induced by the gravitational force is measured by the deflection of a light beam reflected from a mirror attached to the suspension. In modern science, mechano-optical transducers are such devices that could detect, measure and convert a force or displacement signal to an optical one, and are widely used for force detection. Especially, ultraweak force sensor with ultrahigh spatial resolution is highly demanded for detecting force anomaly in surface science, biomolecule imaging, and atomtronics. Here we show a novel scheme using a single trapped ion as a mechano-optical transduction. This…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsMechanical and Optical Resonators · Force Microscopy Techniques and Applications · Advanced MEMS and NEMS Technologies
