Probing the interlayer coupling in 2$H$-NbS$_2$ via soft x-ray angle-resolved photoemission spectroscopy
D. Huang, H. Nakamura, K. K\"uster, U. Wedig, N. B. M. Schr\"oter, V., N. Strocov, U. Starke, H. Takagi

TL;DR
This study uses soft x-ray ARPES to measure interlayer coupling in 2H-NbS2, revealing how atomic structure influences electronic properties and providing insights relevant for superconductivity in layered materials.
Contribution
It introduces a method to explicitly extract interlayer hopping parameters in NbS2 using SX-ARPES and tight-binding modeling, bridging experimental data with first-principles calculations.
Findings
Visualization of S 3p_z bands dispersing with out-of-plane momentum
Quantitative extraction of interlayer hopping parameters
Clarification of atomic distance effects on interlayer coupling
Abstract
In the large family of two-dimensional (2D) layered materials including graphene, its honeycomb analogs, and transition-metal dichalcogenides, the interlayer coupling plays a rather intriguing role. On the one hand, the weak van der Waals interaction that holds the layers together endows these compounds with quasi-2D properties, which might imply small interlayer effects on the electronically active bands. On the other hand, the oft-witnessed differences in electronic, optical, and magnetic behaviors of monolayers, bilayers, and multilayers of the same compound must have as their microscopic origin the detailed interlayer hopping parameters. Given the few experimental reports that have attempted to explicitly extract these parameters, we employ soft-x-ray angle-resolved photoemission spectroscopy (SX-ARPES) to probe the interlayer coupling in superconducting 2-NbS. We visualize…
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