Feedback Lock-in: A versatile multi-terminal measurement system for electrical transport devices
Arthur W. Barnard, Evgeny Mikheev, Joe Finney, Han S. Hiller, and, David Goldhaber-Gordon

TL;DR
The paper introduces a versatile multi-terminal measurement system called feedback lock-in that allows dynamic, programmable electrical contact configurations and sensitive measurements without preamplifiers, demonstrated on advanced materials.
Contribution
A novel feedback lock-in system combining digital control and software lock-in techniques for flexible, multi-terminal electrical measurements without preamplifiers.
Findings
Achieved differential measurement sensitivity comparable to commercial lock-in amplifiers.
Enabled multi-terminal measurements on twisted bilayer graphene and SrTiO3 quantum point contacts.
Demonstrated a new current-biased measurement mode on a ballistic graphene device.
Abstract
We present the design and implementation of a measurement system that enables parallel drive and detection of small currents and voltages at numerous electrical contacts to a multi-terminal electrical device. This system, which we term a feedback lock-in, combines digital control-loop feedback with software-defined lock-in measurements to dynamically source currents and measure small, pre-amplified potentials. The effective input impedance of each current/voltage probe can be set via software, permitting any given contact to behave as an open-circuit voltage lead or as a virtually grounded current source/sink. This enables programmatic switching of measurement configurations and permits measurement of currents at multiple drain contacts without the use of current preamplifiers. Our 32-channel implementation relies on commercially available digital input/output boards, home-built voltage…
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Taxonomy
TopicsQuantum and electron transport phenomena · Advancements in Semiconductor Devices and Circuit Design · Electronic and Structural Properties of Oxides
