Probing quantum devices with radio-frequency reflectometry
Florian Vigneau, Federico Fedele, Anasua Chatterjee, David Reilly,, Ferdinand Kuemmeth, Fernando Gonzalez-Zalba, Edward Laird, Natalia Ares

TL;DR
This paper reviews radio-frequency reflectometry techniques for fast, high-sensitivity measurements of quantum devices, addressing challenges like impedance mismatch and highlighting recent advances and future experimental opportunities.
Contribution
It provides a comprehensive overview of radio-frequency reflectometry principles, optimization strategies, and integration of new tools for improved quantum device measurements.
Findings
Explains how to optimize speed and sensitivity of RF measurements.
Describes incorporation of superconducting circuits and quantum amplifiers.
Motivates new experiments in fast quantum device dynamics.
Abstract
Many important phenomena in quantum devices are dynamic, meaning that they cannot be studied using time-averaged measurements alone. Experiments that measure such transient effects are collectively known as fast readout. One of the most useful techniques in fast electrical readout is radio-frequency reflectometry, which can measure changes in impedance (both resistive and reactive) even when their duration is extremely short, down to a microsecond or less. Examples of reflectometry experiments, some of which have been realised and others so far only proposed, include projective measurements of qubits and Majorana devices for quantum computing, real-time measurements of mechanical motion and detection of non-equilibrium temperature fluctuations. However, all of these experiments must overcome the central challenge of fast readout: the large mismatch between the typical impedance of…
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Taxonomy
TopicsCold Atom Physics and Bose-Einstein Condensates · Quantum and electron transport phenomena · Quantum Information and Cryptography
