Minimum quantum run-time characterization and calibration via restless measurements with dynamic repetition rates

TL;DR

This paper introduces restless measurements with dynamic repetition rates to significantly accelerate quantum processor calibration and characterization, enabling more efficient maintenance and operation of quantum devices.

Contribution

It presents a novel restless measurement technique that speeds up calibration and characterization tasks without data loss, including randomized benchmarking and quantum process tomography.

Findings

Randomized benchmarking is 5.3 times faster with restless measurements.

Calibration with parameter scans is up to 40 times faster.

Methodology for restless quantum process tomography reduces errors.

Abstract

The performance of a quantum processor depends on the characteristics of the device and the quality of the control pulses. Characterizing cloud-based quantum computers and calibrating the pulses that control them is necessary for high-fidelity operations. However, this time intensive task eats into the availability of the device. Here, we show restless measurements with a dynamic repetition rate that speed-up calibration and characterization tasks. Randomized benchmarking is performed 5.3 times faster on the quantum device than when an active reset is used and without discarding any data. In addition, we calibrate a qubit with parameter scans and error-amplifying gate sequences and show speed-ups of up to a factor of forty on the quantum device over active reset. Finally, we present a methodology to perform restless quantum process tomography that mitigates restless state preparation errors. These results reduce the footprint of characterization and calibration tasks. Quantum computers can thus either spend more time running applications or run calibrations more often to maintain gate fidelity.