IEC Flickermeter Measurement Results for Distorted Modulating Signal while Supplied with Distorted Voltage

TL;DR

This study investigates how distorted supply voltages, common in low voltage networks, affect flickermeter measurements by analyzing various modulating signals through simulations and laboratory tests.

Contribution

It provides new insights into the impact of distorted voltage waveforms on flickermeter readings, especially for signals with high modulation frequency and depth.

Findings

Voltage fluctuation severity depends on waveform shape and modulation parameters.

Distorted supply voltages cause measurable variations in flickermeter results.

Numerical simulations align with laboratory test outcomes.

Abstract

The paper presents IEC flickermeter measurement results for voltage fluctuations modelled by amplitude modulation of distorted supply voltage. The supply voltage distortion caused by electronic and power electronic devices in the "clipped cosine" form is assumed. This type of supply voltage distortion is a common disturbance in low voltage networks. Several arbitrary distorted waveforms of the modulating signal with different modulation depth and modulating frequency up to approx. 1 kHz are selected to determine the dependence of severity of voltage fluctuation on their shape. The paper mainly presents the dependence of voltage fluctuation severity with a frequency greater than 3fc, where fc is the power frequency. The voltage fluctuation severity and the dependencies associated with it have been determined on the basis of numerical simulation studies and experimental laboratory tests.