Entanglement of Nambu Spinors and Bell Inequality Test Without Beam Splitters
Wei Luo, Hao Geng, D. Y. Xing, G. Blatter, and Wei Chen

TL;DR
This paper proposes a novel method to detect electronic entanglement in quantum Hall edge states using Nambu spinors, eliminating the need for beam splitters and enabling Bell inequality tests through charge-current measurements.
Contribution
It introduces a new approach to generate and detect electron-hole entanglement in solid-state systems without beam splitters, using Nambu spinors and charge noise measurements.
Findings
Bell inequality violation occurs in a large parameter region.
Charge-current measurement can reveal spinor correlations.
Method is compatible with existing experimental setups.
Abstract
The identification of electronic entanglement in solids remains elusive so far, which is owed to the difficulty of implementing spinor-selective beam splitters with tunable polarization direction. Here, we propose to overcome this obstacle by producing and detecting a particular type of entanglement encoded in the Nambu spinor or electron-hole components of quasiparticles excited in quantum Hall edge states. Due to the opposite charge of electrons and holes, the detection of the Nambu spinor translates into a charge-current measurement, which eliminates the need for beam splitters and assures a high detection rate. Conveniently, the spinor correlation function at fixed effective polarizations derives from a single current-noise measurement, with the polarization directions of the detector easily adjusted by coupling the edge states to a voltage gate and a superconductor, both having…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsQuantum and electron transport phenomena · Physics of Superconductivity and Magnetism · Surface and Thin Film Phenomena
