Direct detection of charged particles with SiPMs
F. Carnesecchi, G. Vignola, N. Agrawal, A. Alici, P. Antonioli, S., Arcelli, F.Bellini, D. Cavazza, L. Cifarelli, M. Colocci, S. Durando, F., Ercolessi, M. Garbini, M. Giacalone, D. Hatzifotiadou, N. Jacazio, A., Margotti, G. Malfattore, R. Nania, F. Noferini, O. Pinazza
TL;DR
This paper systematically studies the direct response of Silicon PhotoMultipliers (SiPMs) to traversing charged particles, measuring time resolution, crosstalk, and sensor characterization, revealing a time resolution of 40-70 ps and unexpected crosstalk levels.
Contribution
First systematic study of SiPM response to charged particles using beam data, including time resolution and crosstalk measurements, with sensor characterization.
Findings
Time resolution around 40-70 ps.
Higher-than-expected crosstalk levels.
Sensor characterization via laser beam.
Abstract
The direct response of Silicon PhotoMultipliers being traversed by a MIP charged particle have been studied in a systematic way for the first time. Using beam test data, time resolution and the crosstalk probability have been measured. A characterization of the SiPM by means of a laser beam is also reported. The results obtained for different sensors indicate a measured time resolution around 40-70 ps. Although particles are expected to traverse only one SPAD per event, crosstalk measurements on different sensors indicate an unexpected higher value with respect to the one related to the sensor noise.
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