Three-dimensional structure from single two-dimensional diffraction intensity measurement

TL;DR

This paper introduces a novel method to reconstruct 3D structures from a single 2D diffraction intensity measurement, surpassing classical resolution limits, useful for radiation-sensitive samples and limited measurement scenarios.

Contribution

It presents a new technique enabling 3D reconstruction from one 2D diffraction image, exceeding traditional resolution constraints.

Findings

Successful 3D reconstruction from a single 2D diffraction pattern

Achieves resolution beyond classical limits

Applicable to radiation-sensitive materials

Abstract

Conventional three-dimensional (3D) imaging methods require multiple measurements of the sample in different orientation or scanning. When the sample is probed with coherent waves, a single two-dimensional (2D) intensity measurement is sufficient as it contains all the information of the 3D sample distribution. We show a method that allows reconstruction of 3D sample distribution from a single 2D intensity measurement, at the z-resolution exceeding the classical limit. The method can be practical for radiation-sensitive materials, or where the experimental setup allows only one intensity measurement.