Tuning of gain layer doping concentration and Carbon implantation effect on deep gain layer
S. M. Mazza, C. Gee, Y. Zhao, R. Padilla, E. Ryan, N. Tournebise, B., Darby, F. McKinney-Martinez, H. F.-W. Sadrozinski, A. Seiden, B. Schumm, V., Cindro, G. Kramberger, I. Mandi\'c, M. Miku\v{z}, M. Zavrtanik, R., Arcidiacono, N. Cartiglia, M. Ferrero, M. Mandurrino, V. Sola

TL;DR
This study compares the effects of gain layer doping and carbon implantation on the performance and radiation hardness of LGAD sensors from HPK and FBK, demonstrating improved radiation tolerance and timing resolution after irradiation.
Contribution
It introduces optimized doping and carbon infusion techniques to enhance LGAD sensors' radiation hardness and timing performance post-irradiation.
Findings
FBK sensors achieved 10 fC charge collection at high fluence.
FBK sensors reached 40 ps timing resolution after irradiation.
HPK sensors maintained performance before irradiation.
Abstract
Next generation Low Gain Avalanche Diodes (LGAD) produced by Hamamatsu photonics (HPK) and Fondazione Bruno Kessler (FBK) were tested before and after irradiation with ~1MeV neutrons at the JSI facility in Ljubljana. Sensors were irradiated to a maximum 1-MeV equivalent fluence of 2.5E15 Neq/cm2. The sensors analysed in this paper are an improvement after the lessons learned from previous FBK and HPK productions that were already reported in precedent papers. The gain layer of HPK sensors was fine-tuned to optimize the performance before and after irradiation. FBK sensors instead combined the benefit of Carbon infusion and deep gain layer to further the radiation hardness of the sensors and reduced the bulk thickness to enhance the timing resolution. The sensor performance was measured in charge collection studies using \b{eta}-particles from a 90Sr source and in capacitance-voltage…
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Taxonomy
TopicsRadiation Detection and Scintillator Technologies · Particle Detector Development and Performance · CCD and CMOS Imaging Sensors
