SparseAlign: A Super-Resolution Algorithm for Automatic Marker Localization and Deformation Estimation in Cryo-Electron Tomography
Poulami Somanya Ganguly, Felix Lucka, Holger Kohr, Erik Franken,, Hermen Jan Hupkes, K Joost Batenburg

TL;DR
SparseAlign introduces a novel super-resolution algorithm that automatically localizes markers and estimates deformation in cryo-electron tomography without manual labeling, improving accuracy in low-contrast and noisy data.
Contribution
It extends a grid-free super-resolution method to jointly localize markers and estimate deformation, eliminating the need for manual marker labeling in cryo-ET.
Findings
Automatically finds markers and estimates deformation reliably.
Works well on noisy and overlapping marker data.
Effective on experimental cryo-ET data.
Abstract
Tilt-series alignment is crucial to obtaining high-resolution reconstructions in cryo-electron tomography. Beam-induced local deformation of the sample is hard to estimate from the low-contrast sample alone, and often requires fiducial gold bead markers. The state-of-the-art approach for deformation estimation uses (semi-)manually labelled marker locations in projection data to fit the parameters of a polynomial deformation model. Manually-labelled marker locations are difficult to obtain when data are noisy or markers overlap in projection data. We propose an alternative mathematical approach for simultaneous marker localization and deformation estimation by extending a grid-free super-resolution algorithm first proposed in the context of single-molecule localization microscopy. Our approach does not require labelled marker locations; instead, we use an image-based loss where we…
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Taxonomy
TopicsAdvanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced X-ray Imaging Techniques
