A Nanomechanical Testing Framework Yielding Front&Rear-Sided, High-Resolution, Microstructure-Correlated SEM-DIC Strain Fields
Tijmen Vermeij, Jorn Verstijnen, Tim Ramirez y Cantador, Benoit, Blaysat, Jan Neggers, Johan Hoefnagels

TL;DR
This paper introduces a comprehensive nanomechanical testing framework that combines high-resolution SEM-DIC strain mapping with microstructure characterization to analyze nanoscale deformation mechanisms in multiphase alloys.
Contribution
It presents a novel integrated approach for nanoscale, microstructure-resolved strain measurement with front&rear-sided SEM-DIC and microstructure alignment, enabling 3D deformation analysis.
Findings
Unveiled nanoscale deformation mechanisms at multiphase interfaces.
Achieved high-resolution, microstructure-correlated strain fields.
Demonstrated the framework on dual-phase steel revealing detailed strain localization.
Abstract
The continuous development of new multiphase alloys with improved mechanical properties requires quantitative microstructure-resolved observation of the nanoscale deformation mechanisms at, e.g., multiphase interfaces. This calls for a combinatory approach beyond advanced testing methods such as microscale strain mapping on bulk material and micrometer sized deformation tests of single grains. We propose a nanomechanical testing framework that has been carefully designed to integrate several state-of-the-art testing and characterization methods: (i) well-defined nano-tensile testing of carefully selected and isolated multiphase specimens, (ii) front&rear-sided SEM-EBSD microstructural characterization combined with front&rear-sided in-situ SEM-DIC testing at very high resolution enabled by a recently developed InSn nano-DIC speckle pattern, (iii) optimized DIC strain mapping aided by…
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Taxonomy
TopicsAdvanced Surface Polishing Techniques · Force Microscopy Techniques and Applications · Microstructure and mechanical properties
