Simulating dark-field x-ray microscopy images with wave front propagation techniques

TL;DR

This paper introduces a numerical simulation method for dark-field X-ray microscopy images using wave front propagation and Takagi-Taupin Equations, validated against experimental data on diamond crystals.

Contribution

The paper presents a novel simulation approach combining wave front propagation with TTE for DFXM image formation, validated against experimental data.

Findings

Simulated images closely match experimental data

Method effectively models defect imaging in crystals

Validation performed on diamond with stacking fault

Abstract

Dark-Field X-ray Microscopy (DFXM) is a diffraction-based synchrotron imaging techique capable of imaging defects in the bulk of extended crystalline samples. We present numerical simulations of image-formation in such a microscope using numerical integration of the dynamical Takagi-Taupin Equations (TTE) and wave front propagation. We validate our approach by comparing simulated images to experimental data from a near-perfect single crystal of diamond containing a single stacking fault defect in the illuminated volume.