Proposal of Plane-Parallel Resonator Configuration for High-NA EUV Lithography
Tsumoru Shintake

TL;DR
This paper proposes a novel plane-parallel resonator configuration for high-NA EUV lithography that enhances image contrast and depth-of-focus by using off-axis illumination and a single-path cavity design, reducing sensitivity to mirror vibrations.
Contribution
It introduces a new resonator setup with off-axis illumination and a Fourier filter, enabling high-contrast, high-DOF imaging in EUV lithography without resonant effects.
Findings
Long depth-of-focus achieved
High image contrast demonstrated
Feasible design with Wolter telescope
Abstract
Plane-parallel resonator configuration is proposed for high-NA EUV lithography, where the lithography mask and the wafer are parallelly arranged through two focusing mirrors. EUV light is injected through an off-axis rotating mirror at the back focal plane and provides off-axis illumination (precession beam) to the mask and bounces back twice (at the mask and the wafer), finally goes out from the resonator through the rotating mirror. This is a single path cavity, there is no resonant effect. The orbital error or vibration of the rotating mirror do not affect on the imaging quality. The off-axis illumination is essential for high-NA optics, which recovers the high spatial frequency, and improves the edge contrast. The matched annular-aperture is located at the back-focal plane of the projector mirror, which acts as Fourier filter passing only the horizontally scattered waves reflected…
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Taxonomy
TopicsAdvancements in Photolithography Techniques · Advanced Surface Polishing Techniques · Advanced optical system design
