Diagnosing the Optically Thick/Thin Features Using the Intensity Ratio of Si IV Resonance Lines in Solar Flares
Yi-an Zhou, Jie Hong, Y. LI, M.D. Ding

TL;DR
This study investigates the intensity ratios of Si IV resonance lines in solar flares to diagnose optical thickness, revealing that line profile ratios vary with opacity while integrated ratios remain near 2, cautioning their use for opacity diagnostics.
Contribution
The paper provides observational analysis of Si IV line ratios in solar flares, highlighting the limitations of using integrated intensity ratios for opacity diagnostics due to profile variations.
Findings
Line ratio R ranges from 1.8 to 2.3 at flare ribbons.
Profile ratio r(Δλ) decreases from blue to red wing.
Integrated ratio R remains close to 2 despite profile variations.
Abstract
In the optically thin regime, the intensity ratio of the two Si IV resonance lines (1394 and 1403 \AA\ ) are theoretically the same as the ratio of their oscillator strengths, which is exactly 2. Here, we study the ratio of the integrated intensity of the Si IV lines () and the ratio of intensity at each wavelength point () in two solar flares observed by the Interface Region Imaging Spectrograph. We find that at flare ribbons, the ratio ranges from 1.8 to 2.3 and would generally decrease when the ribbons sweep across the slit position. Besides, the distribution of shows a descending trend from the blue wing to the red wing. In loop cases, the Si IV line presents a wide profile with a central reversal. The ratio …
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
