Electron backscattering for signal enhancement in a thin-film CdTe radiation detector

TL;DR

This study explores how adding metal back-reflectors and low-Z top layers can enhance signal detection in thin-film CdTe radiation detectors by increasing electron backscattering.

Contribution

The paper introduces a combined simulation and analytical approach to quantify how metal layers and low-Z materials improve electron backscattering and signal in CdTe detectors.

Findings

Adding Cu and Pb layers increases energy deposition by up to 75%.

Low-Z top layers improve electron reflection and signal.

Backscattering correlates linearly with energy deposition.

Abstract

We investigated the possibility of augmenting the fluence of electrons traversing CdTe thin film and thus increasing the detected signal pursuing two venues: adding a high-Z metal layer to the back of the detector surface, and adding a top low-Z material to the detector layer to return its backscattered electrons. Copper (Cu) and lead (Pb) layers of varying thickness were investigated as potential metal back-reflectors, while PMMA was tried as the top cover in multilayer detector structures. The Monte Carlo (MC) radiation transport package MCNP5 was first used to model a basic multilayer structure under a Varian 6MV. It was then modified by the addition of Cu and Pb to analyze the extent of the signal enhancement and changes in secondary electron fluence spectra. Backscattering coefficients were then calculated using EGSnrc for electron sources. Analytical functions were established to represent the best-fitting curves to the simulation data. Finally, electron backscattering data were related to signal enhancement. It was found that adding a metal film below the sensitive volume of a detector increases the fraction of reflected electrons, especially in the low energy range, resulting in ~10% and 75% increased energy deposition using Cu and Pb, respectively. We also established a linear dependence between the energy deposition in the semiconductor layer and the fluence of backscattered electrons in the corresponding multilayer structure. The low-Z top layer in practically implemental thicknesses of tens of microns has a positive effect due to partial electron reflection back to the semiconductor layer. Signal enhancement in a thin-film CdTe radiation detector could be achieved using electron backscattering from metal reflectors. The methodology explored here warrants further studies to quantify achievable signal enhancement for various thin-film and other small sensitive volume detectors.