Imaging Ferroelectrics: Charge Gradient Microscopy (CGM) versus Potential Gradient Microscopy (PGM)
Jesi R. Maguire, Hamza Waseem, Raymond G. P. McQuaid, Amit Kumar, J., Marty Gregg, Charlotte Cochard

TL;DR
This paper compares Charge Gradient Microscopy (CGM) and Kelvin Probe Force Microscopy (KPFM) on ferroelectric materials, revealing that CGM reflects the surface potential gradient and proposing it be called Potential Gradient Microscopy (PGM).
Contribution
It clarifies the fundamental origin of CGM contrast and introduces the concept of PGM, enhancing understanding of ferroelectric surface imaging.
Findings
CGM signals correspond to the surface potential gradient.
Surface potential measured is opposite to expectations for clean ferroelectrics.
CGM can detect in-plane polarization despite being a charge-based technique.
Abstract
In 2014, Charge Gradient Microscopy (CGM) was first reported as a new scanning probe imaging mode, particularly well-suited for the characterisation of ferroelectrics. The implementation of the technique is straightforward; it involves monitoring currents that spontaneously develop between a passive conducting atomic force microscopy tip and Earth, as the tip is scanned across the specimen surface. However, details on the fundamental origin of contrast and what images mean, in terms of associated ferroelectric microstructures, are not yet fully understood. Here, by comparing information from CGM and Kelvin Probe Force Microscopy (KPFM), obtained from the same sets of ferroelectric domains (in both lithium niobate and barium titanate), we show that CGM reasonably reflects the spatial derivative of the measured surface potential. This is conceptually different from measuring local…
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Taxonomy
TopicsForce Microscopy Techniques and Applications · Ferroelectric and Piezoelectric Materials · Analytical Chemistry and Sensors
