Registration-free localization of defects in 3-D parts from mesh metrology data using functional maps
Xueqi Zhao, Enrique del Castillo

TL;DR
This paper introduces a registration-free method using functional maps based on spectral Laplacian techniques for localizing defects on 3D parts from mesh data, improving efficiency and accuracy over registration-based approaches.
Contribution
It proposes a novel registration-free defect localization method using functional maps and a recursive partitioning algorithm for efficient surface analysis.
Findings
Effective localization of defects without registration.
Reduced computational cost through recursive partitioning.
Robustness to noisy measurements with statistical filtering.
Abstract
Spectral Laplacian methods, widely used in computer graphics and manifold learning, have been recently proposed for the Statistical Process Control (SPC) of a sequence of manufactured parts, whose 3-dimensional metrology is acquired with non-contact sensors. These techniques provide an {\em intrinsic} solution to the SPC problem, that is, a solution exclusively based on measurements on the scanned surfaces or 2-manifolds without making reference to their ambient space. These methods, therefore, avoid the computationally expensive, non-convex registration step needed to align the parts, as required by previous methods for SPC based on 3-dimensional measurements. Once a SPC mechanism triggers and out-of-control alarm, however, an additional problem remains: that of locating where on the surface of the part that triggered the SPC alarm there is a significant shape difference with respect…
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Taxonomy
TopicsIndustrial Vision Systems and Defect Detection · Advanced Measurement and Metrology Techniques · 3D Shape Modeling and Analysis
