Simulation-based spectral analysis of X-ray CCD data affected by photon pile-up
Tsubasa Tamba, Hirokazu Odaka, Aya Bamba, Hiroshi Murakami, Koji Mori,, Kiyoshi Hayashida, Yukikatsu Terada, Tsunefumi Mizuno, Masayoshi Nobukawa

TL;DR
This paper introduces a simulation-based spectral analysis method for X-ray CCD data affected by photon pile-up, enabling accurate correction of pile-up effects without losing photon statistics.
Contribution
The authors develop a detailed simulation framework that models nonlinear detector responses due to pile-up, allowing for precise spectral analysis of affected X-ray CCD data.
Findings
Accurately corrects pile-up effects in X-ray CCD data.
Produces results consistent with traditional methods in negligible pile-up cases.
Effectively models pile-up effects across different observation scenarios.
Abstract
We have developed a simulation-based method of spectral analysis for pile-up affected data of X-ray CCDs without any loss of photon statistics. As effects of the photon pile-up appear as complicated nonlinear detector responses, we employ a detailed simulation to calculate the important processes in an X-ray observation including physical interactions, detector signal generation, detector readout, and a series of data reduction processes. This simulation naturally reproduces X-ray-like and background-like events as results of X-ray photon merging in a single pixel or in a chunk of adjacent pixels, allowing us to construct a nonlinear spectral analysis framework that can treat pile-up affected observation data. For validation, we have performed data analysis of Suzaku XIS observations by using this framework with various parameters of the detector simulation all of which are optimized…
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