Robust Fourier ptychographic microscopy via a physics-based defocusing strategy for calibrating angle-varied LED illumination
Chuanjian Zheng, Shaohui Zhang, Guocheng Zhou, Yao Hu, and Qun Hao

TL;DR
This paper introduces a physics-based defocusing method for calibrating LED illumination in Fourier ptychographic microscopy, improving robustness and reducing mechanical adjustments needed for high-quality imaging.
Contribution
A novel defocusing strategy that accurately calibrates LED positions in FPM without mechanical adjustments or data-driven optimization.
Findings
Effective in correcting large positional deviations of LED illumination.
Achieves high-quality reconstruction with randomly placed LED arrays.
Validated through simulations and experiments.
Abstract
Fourier ptychographic microscopy (FPM) is a recently developed computational imaging technique for wide-field, high-resolution microscopy with a high space-bandwidth product. It integrates the concepts of synthetic aperture and phase retrieval to surpass the resolution limit imposed by the employed objective lens. In the FPM framework, the position of each sub-spectrum needs to be accurately known to ensure the success of the phase retrieval process. Different from the conventional methods with mechanical adjustment or data-driven optimization strategies, here we report a physics-based defocusing strategy for correcting large-scale positional deviation of the LED illumination in FPM. Based on a subpixel image registration process with a defocused object, we can directly infer the illumination parameters including the lateral offsets of the light source, the in-plane rotation angle of…
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Taxonomy
TopicsAdvanced X-ray Imaging Techniques · Digital Holography and Microscopy · Advanced Electron Microscopy Techniques and Applications
