Mutual and self-inductance in planarized multilayered superconductor integrated circuits: Microstrips, striplines, bends, meanders, ground plane perforations
Sergey K. Tolpygo, Evan B. Golden, Terence J. Weir, and Vladimir, Bolkhovsky (Lincoln Laboratory, Massachusetts Institute of Technology,, Lexington, MA, United States of America)

TL;DR
This paper presents precise analytical models for mutual and self-inductance in multilayered superconducting integrated circuits, validated by experiments, with implications for circuit design and scalability.
Contribution
It introduces accurate analytical expressions for inductance in superconducting circuits, accounting for various geometries and effects, aiding design and calibration.
Findings
Mutual inductance decreases exponentially with distance between striplines.
Inductance depends strongly on magnetic field penetration depths.
Mutual inductance shows weak dependence on linewidth, affecting circuit scalability.
Abstract
Data are presented on mutual and self-inductance of various inductors used in multilayered superconductor integrated circuits: microstrips and striplines with widths of signal traces from 250 nm to a few micrometers, located on the same circuit layer at various distances from each other (from 250 nm to a few micrometers) and/or on different layers spaced vertically; effect of long slits in the ground plane(s) along the inductors on their mutual inductance; inductance of right-angled bends; inductance of meanders. Simple analytical expressions for mutual and self-inductance of the basic inductors are given, describing experimental data with accuracy better than 2% in a very wide range of parameters. They can be used for superconductor integrated circuit design and calibration of numerical inductance extractors. Measurements were done using circuits fabricated in fully planarized…
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Taxonomy
TopicsPhysics of Superconductivity and Magnetism · Advanced Electrical Measurement Techniques · Magnetic Field Sensors Techniques
