Developing an accurate and robust tool for pixel module characterization

TL;DR

This paper presents a new, precise, and cost-effective infrared laser-based test bench for silicon pixel module characterization, crucial for the ATLAS experiment's high luminosity upgrade.

Contribution

The paper introduces a novel module testing system combining infrared laser scanning and radioactive source analysis for improved accuracy and robustness.

Findings

Successful characterization of a FE-I4 silicon pixel module

Demonstrated system's precision and robustness

Potential for in-situ testing at LHC upgrades

Abstract

For operation at the High Luminosity Large Hadron Collider (LHC), the ATLAS experiment is building a new all-silicon inner tracker (ITk). The production and testing of thousands of silicon pixel and strip modules is required to cover the estimated 180 m$^{2}$ of the total surface area. A compact, affordable and robust module characterization system is required for in-situ testing prior any test beam campaign or installation. A test bench setup based on an infrared laser was developed at IJCLab, allowing also for the use of micro-metric precision scanning with a radioactive source. A detailed schema of the setup, operating principles and testing methods are described in this paper, together with the first results obtained with a FE-I4 silicon pixel module.