Software solutions for numerical modeling of wide-field telescopes
Salvatore Savarese, Pietro Schipani, Giulio Capasso, Mirko Colapietro,, Sergio D'Orsi, Marcella Iuzzolino, Laurent Marty, Francesco Perrotta, Giacomo, Basile

TL;DR
This paper introduces a flexible, integrated software tool that combines ray-tracing and analytical modeling to quickly analyze the PSF of wide-field telescopes affected by misalignments, aiding in real-time correction and design.
Contribution
The paper develops a hybrid approach integrating Zemax ray-tracing with analytical models in a custom software package for rapid PSF analysis of wide-field telescopes.
Findings
Enables quick PSF reconstruction under misalignments
Automates statistical analysis of optical system responses
Provides a general, adaptable modeling framework
Abstract
This paper presents an integrated modeling software to analyze the PSF of wide-field telescopes affected by misalignments. Even relatively small misalignments in the optical system of a telescope can significantly deteriorate the image quality by introducing large aberrations. In particular, wide-field telescopes are critically affected by these errors, insomuch that usually a closed-loop active optics system is adopted for a continuous correction, rather than for sporadic alignment procedures. Typically, a ray-tracing software such as Zemax OpticStudio is employed to accurately analyze the system during the optical design. However, an analytical model of the optical system is preferable when the PSF of the telescope must be reconstructed quickly for algorithmic purposes. Here the analytical model is derived through a hybrid approach and developed in a custom software package, designed…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAdaptive optics and wavefront sensing · Advanced optical system design · Advanced Measurement and Metrology Techniques
