Measurement of the ${}^{136}$Xe two-neutrino double beta decay half-life via direct background subtraction in NEXT
NEXT Collaboration: P. Novella, M. Sorel, A. Us\'on, C. Adams, H., Almaz\'an, V. \'Alvarez, B. Aparicio, A.I. Aranburu, L. Arazi, I.J. Arnquist,, S. Ayet, C.D.R. Azevedo, K. Bailey, F. Ballester, J.M. Benlloch-Rodr\'iguez,, F.I.G.M. Borges, S. Bounasser, N. Byrnes, S. C\'arcel

TL;DR
This paper reports a novel measurement of the ${}^{136}$Xe two-neutrino double beta decay half-life using direct background subtraction with a small detector, demonstrating a new background-model-independent approach for neutrinoless double beta decay searches.
Contribution
Introduces a new background subtraction technique applied to double beta decay measurement with a small detector, enabling background-model-independent searches.
Findings
Measured half-life: $2.34^{+0.80}_{-0.46} imes 10^{21}$ years.
Demonstrated feasibility of background-model-independent neutrinoless double beta decay searches.
Used topology of double-electron tracks for analysis.
Abstract
We report a measurement of the half-life of the Xe two-neutrino double beta decay performed with a novel direct background subtraction technique. The analysis relies on the data collected with the NEXT-White detector operated with Xe-enriched and Xe-depleted xenon, as well as on the topology of double-electron tracks. With a fiducial mass of only 3.5 kg of Xe, a half-life of is derived from the background-subtracted energy spectrum. The presented technique demonstrates the feasibility of unique background-model-independent neutrinoless double beta decay searches.
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