Nanoscale Texture and Microstructure in NdFeAs(O,F)/IBAD-MgO Superconducting Thin Film with Superior Critical Current Properties
Zimeng Guo, Hongye Gao, Keisuke Kondo, Takafumi Hatano, Kazumasa Iida,, Jens H\"anisch, Hiroshi Ikuta, Satoshi Hata

TL;DR
This study investigates the nanoscale texture and microstructure of NdFeAs(O,F) superconducting thin films grown by molecular beam epitaxy, revealing microstructural features that contribute to their high critical current density and superconducting performance.
Contribution
It provides detailed microstructural analysis of NdFeAs(O,F) films and links grain boundary characteristics to their superior superconducting properties, using advanced electron microscopy techniques.
Findings
High critical current density of 2 x 10^6 A/cm^2 at 4.2 K
99% of grain boundaries have misorientation angles below the critical angle
Triple junctions of low-angle grain boundaries act as effective flux pinning centers
Abstract
This paper reports the nanoscale texture and microstructure of a high-performance NdFeAs(O,F) superconducting thin film grown by molecular beam epitaxy on a textured MgO/YO/Hastelloy substrate. The NdFeAs(O,F) film forms a highly textured columnar grain structure by epitaxial growth on the MgO template. Although the film contains stacking faults along the -plane as well as grain boundaries perpendicular to the -plane, good superconducting properties are measured: a critical temperature, , of 46 K and a self-field critical current density, , of at 4.2 K. Automated crystal orientation mapping by scanning precession electron diffraction in transmission electron microscopy is employed to analyze the misorientation angles between adjacent grains in a large ensemble (247 grains). 99% of the grain boundaries show in-plane…
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