A kiloelectron-volt ultrafast electron micro-diffraction apparatus using low emittance semiconductor photocathodes
W. H. Li, C. J. R. Duncan, M. B. Andorf, A. C. Bartnik, E. Bianco, L., Cultrera, A. Galdi, M. Gordon, M. Kaemingk, C. A. Pennington, L. F., Kourkoutis, I. V. Bazarov, J. M. Maxson

TL;DR
This paper presents a novel ultrafast electron micro-diffraction setup using low emittance semiconductor photocathodes, achieving high brightness, micron probe size, and 200 fs time resolution for studying ultrafast phenomena.
Contribution
The work introduces a high-brightness, time-resolved electron diffraction apparatus with a novel photocathode design and detailed characterization, enabling advanced ultrafast material studies.
Findings
Achieved 200 fs temporal resolution and micron-scale spatial resolution.
Demonstrated ultrafast heating measurements in gold crystals.
Measured high beam brightness of 7×10^{13} A/m^2-rad^2 at the sample.
Abstract
We report the design and performance of a time-resolved electron diffraction apparatus capable of producing intense bunches with simultaneously single digit micron probe size, long coherence length, and fs rms time resolution. We measure the 5d (peak) beam brightness at the sample location in micro-diffraction mode to be . To generate high brightness electron bunches, the system employs high efficiency, low emittance semiconductor photocathodes driven with a wavelength near the photoemission threshold at a repetition rate up to 250 kHz. We characterize spatial, temporal, and reciprocal space resolution of the apparatus. We perform proof-of-principle measurements of ultrafast heating in single crystal Au samples and compare experimental results with simulations that account for the effects of multiple-scattering.
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Taxonomy
TopicsAdvanced Electron Microscopy Techniques and Applications · Photocathodes and Microchannel Plates · Electron and X-Ray Spectroscopy Techniques
