Free-electron tomography of few-cycle optical waveforms
Yuya Morimoto, Bo-Han Chen, Peter Baum

TL;DR
This paper introduces a novel method for characterizing ultrashort optical waveforms by using a free-space electron beam that interacts linearly with the optical field, eliminating the need for nonlinear processes or auxiliary pulses.
Contribution
The authors demonstrate a new technique for optical pulse measurement that relies on linear electron-optical interactions, enabling in-situ and high-sensitivity waveform characterization.
Findings
Method achieves sensitivity limited only by electron beam emittance.
Able to characterize optical waveforms without auxiliary sampling pulses.
Potential applications in ultrafast microscopy and free-electron laser diagnostics.
Abstract
Ultrashort light pulses are ubiquitous in modern research, but the electromagnetic field of the optical cycles is usually not easy to obtain as a function of time. Field-resolved pulse characterization requires either a nonlinear-optical process or auxiliary sampling pulses that are shorter than the waveform under investigation, and pulse metrology without at least one of these two prerequisites is often thought to be impossible. Here we report how the optical field cycles of laser pulses can be characterized with a field-linear sensitivity and no short probe events. We let a free-space electron beam cross with the waveform of interest. The randomly arriving electrons interact by means of their elementary charge with the optical waveform in a linear-optical way and reveal the optical cycles as the turning points in a time-integrated deflection histogram on a screen. The sensitivity of…
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