A Systematic Methodology to Compute the Quantum Vulnerability Factors for Quantum Circuits
Daniel Oliveira, Edoardo Giusto, Betis Baheri, Qiang Guan, Bartolomeo, Montrucchio, Paolo Rech

TL;DR
This paper introduces a systematic methodology for quantifying the impact of transient faults on quantum circuit reliability using the Quantum Vulnerability Factor, supported by extensive fault injection simulations and real hardware comparisons.
Contribution
It proposes the Quantum Vulnerability Factor (QVF), a novel metric to evaluate how qubit faults affect quantum circuit outputs, and develops a fault injector tool based on Qiskit for large-scale fault analysis.
Findings
Over 15 million fault injections conducted
Identification of critical qubits affecting output reliability
Guidelines for qubit mapping to mitigate radiation-induced errors
Abstract
Quantum computing is one of the most promising technology advances of the latest years. Once only a conceptual idea to solve physics simulations, quantum computation is today a reality, with numerous machines able to execute quantum algorithms. One of the hardest challenges in quantum computing is reliability. Qubits are highly sensitive to noise, which can make the output useless. Moreover, lately it has been shown that superconducting qubits are extremely susceptible to external sources of faults, such as ionizing radiation. When adopted in large scale, radiation-induced errors are expected to become a serious challenge for qubits reliability. In this paper, we propose an evaluation of the impact of transient faults in the execution of quantum circuits. Inspired by the Architectural and Program Vulnerability Factors, widely adopted to characterize the reliability of classical…
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