Labeling elemental detection sensitivities in part per billion range using conventional geometry synchrotron assisted EDXRF measurements

TL;DR

This study demonstrates that conventional geometry synchrotron-assisted EDXRF can achieve elemental detection limits in the nanogram per gram range, comparable to TXRF, using simple setup and minimal sample quantities.

Contribution

It introduces a quantitative approach to attain sub-ppb detection limits with standard EDXRF geometry, bypassing the need for specialized TXRF setups.

Findings

Detection limits in the ng/g range achieved with simple EDXRF setup.

Comparable sensitivity to TXRF using minimal sample quantities.

Effective use of thin Kapton foil as a sample carrier.

Abstract

Energy dispersive X-ray fluorescence (EDXRF) is a widely used non-destructive technique for micro and trace multi-element analysis of materials. Conventional trials show that using laboratory assisted EDXRF measurements, one can obtain elemental detection limits in the range of {\mu}g/g to sub-{\mu}g/g level. In the present work a quantitative approach has been followed in attempting to explore how is it possible to obtain elemental detection limit in the range of ng/g by using simple EDXRF excitation (45{\deg}- 45{\deg} geometry) instead of using total reflection X-ray fluorescence (TXRF) technique, which renders relatively superior detection limits for different elements. In order to accomplish this, we recorded fluorescence spectrum from a standard reference sample (ICP-IV) in similar experimental conditions. The results show that using a very small quantity of sample on top of a thin kapton foil with a thickness ranging between 25-50 {\mu}m, as a sample carrier, the EDXRF technique may offer comparable elemental detection limits in contrast to TXRF technique.