Local laser oxidation of titanium film for post-fabrication trimming of photonic integrated circuits
Aleksandr V. Tronev (1), Mikhail V. Parfenov (1), Sergey I. Bozhko, (2), Andrey M. Ionov (2), Rais N. Mozhchil (2), Sergey V. Chekmazov (2), Petr, M. Agruzov (1), Igor V. Ilichev (1), Aleksandr V. Shamrai (1) ((1) Ioffe, Institute, Saint Petersburg, Russia

TL;DR
This paper presents a laser oxidation technique for precise, permanent adjustment of optical waveguide properties in photonic circuits, demonstrating significant extinction ratio improvements with minimal material impact.
Contribution
It introduces a novel laser oxidation method for post-fabrication trimming of dielectric waveguides, enabling high-precision control of optical properties.
Findings
Extinction ratio improved up to 57 dB
Technique minimally affects waveguide material
Applicable across various photonic device platforms
Abstract
Local laser oxidation of a thin titanium film is considered as a means of a precise adjustment of losses and effective refractive index of dielectric optical waveguides. A fine phase control of an operating point and extinction ratio enhancement up to 57 dB were demonstrated using an integrated optical Ti:LiNbO3 Mach-Zehnder modulator. This technique only slightly affects the dielectric waveguide material and is very promising for a high precision permanent trimming of photonic devices based on dielectric waveguides of different material platforms and fabrication technologies.
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