Light yield and field dependence measurement in PandaX-II dual-phase xenon detector
Zhou Huang, Abdusalam Abdukerim, Zihao Bo, Wei Chen, Xun Chen, Yunhua, Chen, Chen Cheng, Yunshan Cheng, Xiangyi Cui, Yingjie Fan, Deqing Fang,, Changbo Fu, Mengting Fu, Lisheng Geng, Karl Giboni, Linhui Gu, Xuyuan Guo, Ke, Han, Changda He, Jinrong He, Di Huang, Yanlin Huang
TL;DR
This paper measures how the light yield in the PandaX-II dual-phase xenon detector varies with electric field strength, providing essential data for optimizing dark matter detection sensitivity.
Contribution
It presents the first detailed measurement of light yield dependence on electric field in a large-scale dual-phase xenon detector for dark matter searches.
Findings
Light yield varies with electric field strength.
Measured light yield up to 236 keV energy depositions.
Data aids in optimizing detector performance.
Abstract
The dual-phase xenon time projection chamber (TPC) is one of the most sensitive detector technology for dark matter direct search, where the energy deposition of incoming particle can be converted into photons and electrons through xenon excitation and ionization. The detector response to signal energy deposition varies significantly with the electric field in liquid xenon. We study the detector's light yield and its dependence on the electric field in the PandaX-II dual-phase detector containing 580~kg liquid xenon in the sensitive volume. From our measurements, the light yield at electric fields from 0~V/cm to 317~V/cm is obtained for energy depositions up to 236~keV.
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Taxonomy
TopicsDark Matter and Cosmic Phenomena · Stellar, planetary, and galactic studies · Atomic and Subatomic Physics Research