Mitigating Quantum Errors via Truncated Neumann Series
Kun Wang, Yu-Ao Chen, and Xin Wang

TL;DR
This paper introduces a scalable quantum error mitigation framework using truncated Neumann series to effectively reduce gate and measurement errors in quantum computations, improving accuracy without extensive error characterization.
Contribution
The paper proposes a unified, scalable error mitigation method that does not require detailed error models or tomography, enhancing near-term quantum device capabilities.
Findings
Error estimation error decays exponentially with truncated order
Error mitigation overhead is independent of system size under moderate noise
Numerical tests show substantial improvement in computation accuracy
Abstract
Quantum gates and measurements on quantum hardware are inevitably subject to hardware imperfections that lead to quantum errors. Mitigating such unavoidable errors is crucial to explore the power of quantum hardware better. In this paper, we propose a unified framework that can mitigate quantum gate and measurement errors in computing quantum expectation values utilizing the truncated Neumann series. The essential idea is to cancel the effect of quantum error by approximating its inverse via linearly combining quantum errors of different orders produced by sequential applications of the quantum devices with carefully chosen coefficients. Remarkably, the estimation error decays exponentially in the truncated order, and the incurred error mitigation overhead is independent of the system size, as long as the noise resistance of the quantum device is moderate. We numerically test this…
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Taxonomy
TopicsQuantum Computing Algorithms and Architecture · Quantum Information and Cryptography · Advancements in Semiconductor Devices and Circuit Design
