Radiation hardness study using SiPMs with single-cell readout
E. Garutti, E. Popova, P. Parygin, O. Bychkova, A. Kaminsky, S., Martens, J. Schwandt, A. Stifutkin

TL;DR
This study investigates how single-cell SiPMs' gain and turn-off voltage are affected by neutron radiation, revealing specific changes in performance after exposure to high fluence levels.
Contribution
It introduces a dedicated single-cell SiPM design to precisely measure radiation damage effects on gain and turn-off voltage.
Findings
Gain decreases by 19% after neutron exposure
Turn-off voltage increases by approximately 0.5 V
Radiation effects quantified up to a fluence of 5e13 cm^-2
Abstract
A dedicated single-cell SiPM structure is designed and measured to investigate the radiation damage effects on the gain and turn-off voltage of SiPMs exposed to a reactor neutron fluence up to = 5e13 cm. The cell has a pitch of 15 m. The fluence dependence of gain and turn-off voltage are reported. A reduction of the gain by 19% and an increase of by 0.5 V is observed after = 5e13 cm.
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Taxonomy
TopicsSemiconductor materials and devices · Advancements in Semiconductor Devices and Circuit Design · Advanced Memory and Neural Computing
