Origin of C$_{60}$ surface reconstruction resolved by atomic force microscopy

TL;DR

This study uses advanced atomic force microscopy to clarify the surface reconstruction mechanism of C60 fullerenes on copper, revealing specific adsorption sites and supporting a vacancy-based model for the surface structure.

Contribution

It provides direct experimental evidence of adsorption sites and surface reconstruction mechanisms of C60 on Cu(111) using tip-functionalized ncAFM.

Findings

C60 adsorbs with three distinct heights on Cu(111).

Identification of specific adsorption sites supports a vacancy model.

Surface reconstruction involves top-layer hollow sites, vacancies, and nanopits.

Abstract

Surface adsorption of C$_{60}$ affects its chemical and electronic properties. Numerous studies have reported observation of bright and dark fullerenes on metal surfaces that suggest extensive surface reconstruction, however, the underpinning mechanism of the reconstruction remains under debate. Here we report tip-functionalised non-contact atomic force microscope (ncAFM) measurements which unambiguously reveal that C$_{60}$ fullerenes adsorb with three well-defined adsorption heights on the Cu(111) surface, consistent with theoretical reports of top-layer hollow site, single-atom vacancies, and surface nanopits. Using single molecule resolution $\Delta f(z)$ measurements we identify well defined adsorption heights specific to each site, confirming the presence of a complex vacancy model for C$_{60}$ monolayers on metal surfaces.