Artificial confocal microscopy for deep label-free imaging
Xi Chen, Mikhail E. Kandel, Shenghua He, Chenfei Hu, Young Jae Lee,, Kathryn Sullivan, Gregory Tracy, Hee Jung Chung, Hyun Joon Kong, Mark, Anastasio, Gabriel Popescu

TL;DR
This paper introduces artificial confocal microscopy (ACM), a nondestructive, label-free imaging technique that combines phase imaging and neural networks to achieve confocal-like depth resolution and specificity in thick specimens.
Contribution
The authors develop a novel method that uses phase imaging and deep learning to replicate confocal microscopy features without labels or phototoxicity.
Findings
ACM provides significantly improved depth sectioning over input images.
ACM enables segmentation and measurement of nuclei within dense spheroids.
The trained neural network can be transferred across different media.
Abstract
Widefield microscopy methods applied to optically thick specimens are faced with reduced contrast due to spatial crosstalk, in which the signal at each point is the result of a superposition from neighboring points that are simultaneously illuminated. In 1955, Marvin Minsky proposed confocal microscopy as a solution to this problem. Today, laser scanning confocal fluorescence microscopy is broadly used due to its high depth resolution and sensitivity, which come at the price of photobleaching, chemical, and photo-toxicity. Here, we present artificial confocal microscopy (ACM) to achieve confocal-level depth sectioning, sensitivity, and chemical specificity, on unlabeled specimens, nondestructively. We augmented a laser scanning confocal instrument with a quantitative phase imaging module, which provides optical pathlength maps of the specimen on the same field of view as the…
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Taxonomy
TopicsDigital Holography and Microscopy · Advanced Fluorescence Microscopy Techniques · Optical Coherence Tomography Applications
