Spin- and time-resolved photoelectron spectroscopy and diffraction studies using time-of-flight momentum microscopes
Gerd Sch\"onhense, Hans-Joachim Elmers

TL;DR
This paper introduces and demonstrates the capabilities of spin- and time-resolved photoelectron spectroscopy using time-of-flight momentum microscopes across various spectral ranges, revealing detailed electronic and spin structures in complex materials.
Contribution
It presents the development and application of a novel spin-resolved ToF momentum microscopy technique for multidimensional photoemission analysis across UV to hard X-ray energies.
Findings
Demonstrated spin mapping of Heusler compounds showing half-metallicity.
Revealed Rashba-type spin texture on Re(0001).
Mapped bulk band structures and Fermi surfaces in multiple materials.
Abstract
Momentum microscopy (MM) is a novel way of performing angular-resolved photoelectron spectroscopy (ARPES). Combined with time-of-flight (ToF) energy recording, its high degree of parallelization is advantageous for photon-hungry experiments like ARPES at X-ray energies and spin-resolved ARPES. This article introduces into the spin-resolved variant of ToF-MM and illustrates its performance by selected examples obtained in different spectral ranges. In a multidimensional view of the photoemission process, spectral density function , spin polarization and related quantities of circular dichroism in the angular distribution (CDAD) are part of the complete experiment, a concept adopted from atomic photoemission. We show examples of spin-resolved valence-band mapping in the UV, VUV, soft- and hard-X-ray range. Spin mapping of the Heusler compounds CoMnGa and…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsMagnetic properties of thin films · Topological Materials and Phenomena · Advanced Electron Microscopy Techniques and Applications
