Single-shot wide-field topography measurement using spectrally multiplexed reflection intensity holography via space-domain Kramers-Kronig relations

TL;DR

This paper introduces a novel single-shot, full-field surface topography measurement technique that employs spectrally multiplexed holography and Kramers-Kronig relations to achieve high-resolution nanostructure imaging.

Contribution

The method combines spectral multiplexing with Kramers-Kronig holography for rapid, high-resolution surface topography measurement in a single shot, advancing surface metrology capabilities.

Findings

Successfully measured nanometer-scale structures

Validated results with atomic force microscopy

Achieved high-resolution topographic imaging in a single shot

Abstract

Surface topology measurements of micro- or nanostructures is essential for both scientific and industrial applications. However, high-throughput measurements remain challenging in surface metrology. We present a single-shot full-field surface topography measurement using Kramers-Kronig holographic imaging and spectral multiplexing. Three different intensity images at different incident angles were simultaneously measured with three different colors, from which a quantitative phase image was retrieved using spatial Kramers-Kronig relations. A high-resolution topographic image of the sample was then reconstructed using synthetic aperture holography. Various patterned structures at the nanometer scale were measured and cross-validated using atomic force microscopy.